This 2-day workshop will highlight the difference between Early Life and Longer-term design reliability and how to design different reliability tests to detect the different failure mechanisms. It will cover why Early Life reliability is so critical to new product success. The ways to apply Test Strength models to make sure you maximize the defect detectability of your reliability testing. Attendees will not only learn how to set up Design Reliability testing in totally different way to their existing approach, they will also learn how to perform reliability testing at sub assembly level and avoid the high cost of complex product reliability testing.
This course will discuss how to develop unique Accelerated Life Testing for any Electronic or Electro-Mechanical Product. Participants will also gain knowledge on how to set up Design Quality Testing and measure Design Quality Maturity measurement as Key Performance Indicator (KPI) during development. The course facilitator will guide you in taking Process Failure data and converting them into Early Life failure rate prediction and avoid the need for expensive Ongoing Reliability Testing (ORT) during volume manufacture. Bottom line, delegates will know how to make their Reliability test approach world class.