International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

When:
July 4, 2017 – July 7, 2017 all-day
2017-07-04T00:00:00-07:00
2017-07-08T00:00:00-07:00
Where:
Chengdu
China

http://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=40862

The IPFA will be devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies.

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