IEEE Santa Clara – Telemetry for IC Reliability

September 7, 2017 @ 6:00 pm – 8:00 pm
Inc. (Building-B Cafeteria) 3165 Kifer Road Santa Clara

Telemetry, the acquisition of IC usage data remotely in the field, is a pillar of knowledge-based qualification and reliability modeling methods because it provides data about actual IC use conditions. We will first motivate the value of telemetry in the context of reliability engineering. Then, we will explain a six stage framework for telemetry work which enables value to be derived. Last, we will provide a range of telemetry examples for the development of use conditions and other uses.

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