IEEE Santa Clara – Telemetry for IC Reliability

When:
September 7, 2017 @ 6:00 pm – 8:00 pm
2017-09-07T18:00:00-07:00
2017-09-07T20:00:00-07:00
Where:
Qualcomm
Inc. (Building-B Cafeteria) 3165 Kifer Road Santa Clara
CA

https://www.eventbrite.com/e/telemetry-for-ic-reliability-tickets-37010193485

Telemetry, the acquisition of IC usage data remotely in the field, is a pillar of knowledge-based qualification and reliability modeling methods because it provides data about actual IC use conditions. We will first motivate the value of telemetry in the context of reliability engineering. Then, we will explain a six stage framework for telemetry work which enables value to be derived. Last, we will provide a range of telemetry examples for the development of use conditions and other uses.

Leave a Reply

Your email address will not be published. Required fields are marked *