IEEE North Atlantic Test Workshop (NATW)

When:
May 8, 2017 – May 10, 2017 all-day
2017-05-08T00:00:00-07:00
2017-05-11T00:00:00-07:00
Where:
Warwick
RI
USA

http://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=40997

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. In addition to traditional topics, the 26th NATW will feature a general theme of “Synthesis and Reliability.” Topics are not limited to, the following: Analog, Mixed Signal and RF Testing Built-In Self-Test (BIST) Board Level Testing Delay and Performance Testing Design Verification/Validation Diagnosis and Debug Fault Modeling/Simulation FPGA and Embedded Core Testing IDDQ Testing DFM, Defect Analysis and Defect-Based Testing Memory and MEMS Testing Nanotechnology Testing Online Testing System-on-Chip (SoC) Test and DebugTest Quality/System Reliability.

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