Advancing HALT & HASS: Moving to Comparative Limit Analysis
February 15-17, 2011 – Tuesday thru Thursday
$600 per person
8:30 AM – 10:30 AM PST
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Required: Windows® 7, Vista, XP or 2003 Server
Required: Mac OS® X 10.4.11 (Tiger®) or newer
Reliability engineering historically has been focused on component wear-out or “absolute life” where a component or subsystem catastrophically fails. Operational reliability, that is, failures of operation that can be recovered from by power cycling may not have been typically a part of HALT. Even though HALT has been used by many companies to insure that their designs are robust and reliable, many of the same companies may have significant levels of warranty returns that when tested have no apparent problems. Many of these apparent failures can be due to lot-to-lot marginal signal integrity or variations in signal timing and propagation. This can lead to costly churn of good parts replacing apparently good parts.
This webinar provides a basic review how to perform HALT, with examples and case histories, and the difference in the HALT methods over traditional reliability theories and approaches. We give the details on how over time traditional reliability methods add cost with little reliability improvement benefit. We then show how to do boundary mapping with multi-dimensional combinations of stress to determine operational or functional reliability risk. Additionally these methods help determine cost effective component and sub-system selection during design and insure margins during HASS. We show how in particular the use of thermal stresses and limit comparisons result in designs are more tolerant of lot-to-lot and second source parts variations during product development.
Kirk Gray, BSEE, began working with Dr. Gregg Hobbs at StorageTek in 1989 and has 20 years experience of consulting, teaching and using HALT. He has over 32 years in the electronics manufacturing industry, the last 7 as a Senior Reliability Engineer at Dell, where he architected the HALT to HASA development process on Power Supply Units (PSU) that became a standard for Dell Suppliers. He is a founding member of the IEEE/CPMT Committee on Accelerated Stress Testing.